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Journal description
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Details for article 32 of 32 found articles
| Title: |
Thickness profiling of transparent plate using wavelength-tuned phase-shifting analysis |
| Author: |
Kim, Yangjin Moon, Younghoon Hibino, Kenichi Mitsuishi, Mamoru |
| Appeared in: |
Measurement |
| Paging: | Volume 161 () nr. C pages p. |
| Year: |
2020 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 32 of 32 found articles
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