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Journal description
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Details for article 51 of 52 found articles
| Title: |
30 Years of atomic force microscopy: Creep, hysteresis, cross-coupling, and vibration problems of piezoelectric tube scanners |
| Author: |
Habibullah, H. |
| Appeared in: |
Measurement |
| Paging: | Volume 159 () nr. C pages p. |
| Year: |
2020 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 51 of 52 found articles
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