X-ray microbeam characterisation of crystalline defects in small pixel GaAs:Cr detectors
Titel:
X-ray microbeam characterisation of crystalline defects in small pixel GaAs:Cr detectors
Auteur:
Wheater, R.M. Jowitt, L. Richards, S. Veale, M.C. Wilson, M.D. Fox, O.J.L. Sawhney, K.J.S. Lozinskaya, A.D. Shemeryankina, A. Tolbanov, O.P. Tyazhev, A. Zarubin, A.N.
Verschenen in:
Nuclear instruments and methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment