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Analysis of multiple cell upset characteristics for logical circuits in radiation environment |
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Titel: |
Analysis of multiple cell upset characteristics for logical circuits in radiation environment |
Auteur: |
Ding, Lili Wang, Tan Zhang, Fengqi Pan, Xiaoyu Chen, Wei Chen, Rongmei Yang, Guoqing |
Verschenen in: |
Nuclear instruments and methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment |
Paginering: |
Jaargang 984 () nr. C pagina's p. |
Jaar: |
2020 |
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Uitgever: |
Published by Elsevier B.V. |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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