Characterization of monolithic CMOS pixel sensor chip with ion beams for application in particle computed tomography
Titel:
Characterization of monolithic CMOS pixel sensor chip with ion beams for application in particle computed tomography
Auteur:
Tambave, G. Alme, J. Barnaföldi, G.G. Barthel, R. van den Brink, A. Brons, S. Chaar, M. Eikeland, V. Genov, G. Grøttvik, O. Pettersen, H.E.S. Pastuovic, Z. Huiberts, S. Helstrup, H. Hetland, K.F. Mehendale, S. Meric, I. Malik, Q.W. Odland, O.H. Papp, G. Peitzmann, T. Piersimoni, P. Ur Rehman, A. Reidt, F. Richter, M. Röhrich, D. Sudar, A. Samnøy, A.T. Seco, J. Shafiee, H. Skjæveland, E.V. Sølie, J.R. Ullaland, K. Varga-Kofarago, M. Volz, L. Wagner, B. Yang, S.
Verschenen in:
Nuclear instruments and methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment