|
Single particle transient response and displacement damage in CMOS image sensors induced by high energy neutrons at Back-n in CSNS facility |
|
|
|
Titel: |
Single particle transient response and displacement damage in CMOS image sensors induced by high energy neutrons at Back-n in CSNS facility |
Auteur: |
Wang, Zujun Xue, Yuanyuan Chen, Wei Ning, Hao Xu, Rui Guo, Xiaoqiang Sheng, Jiangkun Yao, Zhibin He, Baoping Ma, Wuying Dong, Guantao |
Verschenen in: |
Nuclear instruments and methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment |
Paginering: |
Jaargang 920 (2019) nr. C pagina's 68-72 |
Jaar: |
2019 |
Inhoud: |
|
Uitgever: |
Elsevier B.V. |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
|
|
|
|