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Charge-collection properties of irradiated depleted CMOS pixel test structures |
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Titel: |
Charge-collection properties of irradiated depleted CMOS pixel test structures |
Auteur: |
Mandić, I. Cindro, V. Gorišek, A. Hiti, B. Kramberger, G. Zavrtanik, M. Mikuž, M. Hemperek, T. |
Verschenen in: |
Nuclear instruments and methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment |
Paginering: |
Jaargang 903 () nr. C pagina's 126-133 |
Jaar: |
2018 |
Inhoud: |
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Uitgever: |
Elsevier B.V. |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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