Digital Library
Close Browse articles from a journal
 
Search for with title:
ABCDEFGHIJKLMNOPQRSTUVWXYZ

 
<< previous    next >>
     Journal description
       All volumes of the corresponding journal
         All issues of the corresponding volume
           All articles of the corresponding issues
                                       Details for article 50 of 81 found articles
 
 
  Radiation hardness tests and characterization of the CLARO-CMOS, a low power and fast single-photon counting ASIC in 0.35micron CMOS technology
 
 
Title: Radiation hardness tests and characterization of the CLARO-CMOS, a low power and fast single-photon counting ASIC in 0.35micron CMOS technology
Author: Fiorini, M.
Andreotti, M.
Baldini, W.
Calabrese, R.
Carniti, P.
Cassina, L.
Cotta Ramusino, A.
Giachero, A.
Gotti, C.
Luppi, E.
Maino, M.
Malaguti, R.
Pessina, G.
Tomassetti, L.
Appeared in: Nuclear instruments and methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment
Paging: Volume 766 (2014) nr. C pages 3 p.
Year: 2014
Contents:
Publisher: Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 50 of 81 found articles
 
<< previous    next >>
 
 Koninklijke Bibliotheek - National Library of the Netherlands