X-ray characterization of CMOS imaging detector with high resolution for fluoroscopic imaging application
Titel:
X-ray characterization of CMOS imaging detector with high resolution for fluoroscopic imaging application
Auteur:
Cha, Bo Kyung Kim, Cho Rong Jeon, Seongchae Kim, Ryun Kyung Seo, Chang-Woo Yang, Keedong Heo, Duchang Lee, Tae-Bum Shin, Min-Seok Kim, Jong-Boo Kwon, Oh-Kyung
Verschenen in:
Nuclear instruments and methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment