Xenon purity analysis for EXO-200 via mass spectrometry
Titel:
Xenon purity analysis for EXO-200 via mass spectrometry
Auteur:
Dobi, A. Hall, C. Slutsky, S. Yen, Y.-R. Aharmin, B. Auger, M. Barbeau, P.S. Benitez-Medina, C. Breidenbach, M. Cleveland, B. Conley, R. Cook, J. Cook, S. Counts, I. Craddock, W. Daniels, T. Davis, C.G. Davis, J. deVoe, R. Dixit, M. Dolinski, M.J. Donato, K. Fairbank Jr., W. Farine, J. Fierlinger, P. Franco, D. Giroux, G. Gornea, R. Graham, K. Gratta, G. Green, C. Hagemann, C. Hall, K. Hallman, D. Hargrove, C. Herrin, S. Hughes, M. Hodgson, J. Juget, F. Karelin, A. Kaufman, L.J. Kuchenkov, A. Kumar, K. Leonard, D.S. Lutter, G. Mackay, D. MacLellan, R. Marino, M. Mong, B. Montero Díez, M. Morgan, P. Müller, A.R. Neilson, R. Odian, A. O'Sullivan, K. Piepke, A. Pocar, A. Prescott, C.Y. Pushkin, K. Rivas, A. Rollin, E. Rowson, P.C. Sabourov, A. Sinclair, D. Skarpaas, K. Stekhanov, V. Strickland, V. Swift, M. Twelker, K. Vuilleumier, J.-L. Vuilleumier, J.-M. Weber, M. Wichoski, U. Wodin, J. Wright, J.D. Yang, L.
Verschenen in:
Nuclear instruments and methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment