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First results in micromapping the sensitivity to SEE of an electronic device in a SOI technology at the LNL IEEM |
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Titel: |
First results in micromapping the sensitivity to SEE of an electronic device in a SOI technology at the LNL IEEM |
Auteur: |
Mattiazzo, S. Bisello, D. Giubilato, P. Kaminsky, A. Pantano, D. Silvestrin, L. Tessaro, M. Wyss, J. |
Verschenen in: |
Nuclear instruments and methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment |
Paginering: |
Jaargang 658 (2011) nr. 1 pagina's 4 p. |
Jaar: |
2011 |
Inhoud: |
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Uitgever: |
Elsevier B.V. |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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