Testing of surface properties pre-rad and post-rad of n-in-p silicon sensors for very high radiation environment
Titel:
Testing of surface properties pre-rad and post-rad of n-in-p silicon sensors for very high radiation environment
Auteur:
Lindgren, S. Affolder, A.A. Allport, P.P. Bates, R. Betancourt, C. Bohm, J. Brown, H. Buttar, C. Carter, J.R. Casse, G. Chen, H. Chilingarov, A. Cindro, V. Clark, A. Dawson, N. DeWilde, B. Doherty, F. Dolezal, Z. Eklund, L. Fadeyev, V. Ferrèrre, D. Fox, H. French, R. García, C. Gerling, M. Gonzalez Sevilla, S. Gorelov, I. Greenall, A. Grillo, A.A. Hamasaki, N. Hara, K. Hatano, H. Hoeferkamp, M. Hommels, L.B.A. Ikegami, Y. Jakobs, K. Kierstead, J. Kodys, P. Köhler, M. Kohriki, T. Kramberger, G. Lacasta, C. Li, Z. Lynn, D. Maddock, P. Mandić, I. Martinez-McKinney, F. Garcia, S.Martíi Maunu, R. McCarthy, R. Metcalfe, J. Mikestikova, M. Mikuž, M. Miñano, M. Mitsui, S. O’Shea, V. Parzefall, U. Sadrozinski, H.F.-W. Schamberger, D. Seiden, A. Terada, S. Paganis, S. Robinson, D. Puldon, D. Sattari, S. Seidel, S. Toms, K. Tsionou, D. Unno, Y. Von Wilpert, J. Wormald, M. Wright, J. Yamada, M.
Verschenen in:
Nuclear instruments and methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment