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Radiation effects in silicon-on-insulator transistors with back-gate control method fabricated with OKI Semiconductor 0.20μm FD-SOI technology |
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Titel: |
Radiation effects in silicon-on-insulator transistors with back-gate control method fabricated with OKI Semiconductor 0.20μm FD-SOI technology |
Auteur: |
Kochiyama, M. Sega, T. Hara, K. Arai, Y. Miyoshi, T. Ikegami, Y. Terada, S. Unno, Y. Fukuda, K. Okihara, M. |
Verschenen in: |
Nuclear instruments and methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment |
Paginering: |
Jaargang 636 (2011) nr. 1S pagina's 6 p. |
Jaar: |
2011 |
Inhoud: |
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Uitgever: |
Elsevier B.V. |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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