Ionizing radiation effects on a 64-channel charge measurement ASIC designed in CMOS 0.35μm technology
Title:
Ionizing radiation effects on a 64-channel charge measurement ASIC designed in CMOS 0.35μm technology
Author:
La Rosa, A. Marchetto, F. Pardo, J. Donetti, M. Attili, A. Bourhaleb, F. Cirio, R. Garella, M.A. Giordanengo, S. Givehchi, N. Iliescu, S. Mazza, G. Pecka, A. Peroni, C. Pittà, G.
Appeared in:
Nuclear instruments and methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment