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                                       Details for article 18 of 46 found articles
 
 
  DLTS measurements of radiation induced defects in epitaxial and MCz silicon detectors
 
 
Title: DLTS measurements of radiation induced defects in epitaxial and MCz silicon detectors
Author: Hönniger, F.
Fretwurst, E.
Lindström, G.
Kramberger, G.
Pintilie, I.
Röder, R.
Appeared in: Nuclear instruments and methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment
Paging: Volume 583 (2007) nr. 1 pages 5 p.
Year: 2007
Contents:
Publisher: Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 18 of 46 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands