Beam-test of CMOS pixel sensors with 6GeV electrons
Titel:
Beam-test of CMOS pixel sensors with 6GeV electrons
Auteur:
Contarato, D. Adamus, M. Ciborowski, J. Fretwurst, E. Haas, T. Hauschildt, J. Klanner, R. Kötz, U. Löhr, B. Muhl, C. Polini, A. Sztuk, J. Tyszkiewicz, A. Zeuner, W.
Verschenen in:
Nuclear instruments and methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment