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Journal description
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Details for article 18 of 27 found articles
| Title: |
Novel X-ray diffraction microscopy technique for measuring textured grains of thin-films |
| Author: |
Yi, J.M. Je, J.H. Chu, Y.S. Cullen, W.G. You, H. |
| Appeared in: |
Nuclear instruments and methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment |
| Paging: | Volume 551 (2005) nr. 1 pages 5 p. |
| Year: |
2005 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 18 of 27 found articles
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