New evidence of dominant processing effects in standard and oxygenated silicon diodes after neutron irradiation
Titel:
New evidence of dominant processing effects in standard and oxygenated silicon diodes after neutron irradiation
Auteur:
Candelori, A. Rando, R. Bisello, D. Campabadal, F. Cindro, V. Fonseca, L. Kaminski, A. Litovchenko, A. Lozano, M. Martı́nez, C. Moreno, A. Rafi, J.M. Santander, J. Ullán, M. Wyss, J.
Verschenen in:
Nuclear instruments and methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment