Study of radiation damage and substrate resistivity effects from beam test of silicon microstrip detectors using LHC readout electronics
Titel:
Study of radiation damage and substrate resistivity effects from beam test of silicon microstrip detectors using LHC readout electronics
Auteur:
Angarano, M.M Beaumont, W Biasini, M Bilei, G.M Brunetti, M.T Checcucci, B Civinini, C Coughlan, J Creanza, D de Palma, M Drouhin, F Fanò, L Fiore, L French, M Furtjes, A Giassi, A Giorgi, M Gutleber, J Hall, G Lariccia, P Loreti, M Maggi, G Mantovani, G Marinelli, N Mattig, P Messina, G My, S Papi, A Radicci, V Raymond, M Santinelli, R Selvaggi, G Servoli, L Silvestris, L Tempesta, P Tsirou, A Verdini, P.G Wittmer, B
Verschenen in:
Nuclear instruments and methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment