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Diffraction method for structure investigations of semiconductor heterosystems using synchrotron variable wavelength |
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Titel: |
Diffraction method for structure investigations of semiconductor heterosystems using synchrotron variable wavelength |
Auteur: |
Trukhanov, E.M Revenko, M.A Amirzhanov, R.M Fedorov, A.A Kolesnikov, A.V Nikitenko, S.G Vasilenko, A.P |
Verschenen in: |
Nuclear instruments and methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment |
Paginering: |
Jaargang 448 (2000) nr. 1-2 pagina's 4 p. |
Jaar: |
2000 |
Inhoud: |
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Uitgever: |
Elsevier Science B.V. |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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