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Journal description
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Details for article 2 of 26 found articles
| Title: |
A transient conductance technique for characterisation of deep-level defects in highly irradiated detector-grade silicon |
| Author: |
Alexiev, D Reinhard, M.I Mo, L Rosenfeld, A |
| Appeared in: |
Nuclear instruments and methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment |
| Paging: | Volume 434 (1999) nr. 1 pages 11 p. |
| Year: |
1999 |
| Contents: | |
| Publisher: |
Elsevier Science B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 2 of 26 found articles
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