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A quantitative explanation of low-energy tailing features of Si(Li) and Ge X-ray detectors, using synchrotron radiation |
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Titel: |
A quantitative explanation of low-energy tailing features of Si(Li) and Ge X-ray detectors, using synchrotron radiation |
Auteur: |
Campbell, J.L. Cauchon, G. Lépy, M.-C. McDonald, L. Plagnard, J. Stemmler, P. Teesdale, W.J. White, G. |
Verschenen in: |
Nuclear instruments and methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment |
Paginering: |
Jaargang 418 (1998) nr. 2-3 pagina's 11 p. |
Jaar: |
1998 |
Inhoud: |
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Uitgever: |
Elsevier Science B.V. |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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