Beam test results of an ion-implanted capacitively coupled silicon strip detector processed on a 100 mm silicon wafer
Titel:
Beam test results of an ion-implanted capacitively coupled silicon strip detector processed on a 100 mm silicon wafer
Auteur:
Hietanen, I. Lindgren, J. Orava, R. Tuuva, T. Brenner, R. Andersson, M. Leinonen, K. Ronkainen, H. Turala, M. Weilhammer, P. Dulinski, W. Husson, D. Lounis, A. Schaeffer, M. Turchetta, R. Chauveau, J.
Verschenen in:
Nuclear instruments and methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment