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Ellipsoid X-ray focussing for synchrotron-radiation microprobe analysis at the SRS, Daresbury, UK |
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Titel: |
Ellipsoid X-ray focussing for synchrotron-radiation microprobe analysis at the SRS, Daresbury, UK |
Auteur: |
van Langevelde, F. Bowen, D.K. Tros, G.H.J. Vis, R.D. Huizing, A. De Boer, D.K.G. |
Verschenen in: |
Nuclear instruments and methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment |
Paginering: |
Jaargang 292 (1990) nr. 3 pagina's 9 p. |
Jaar: |
1990 |
Inhoud: |
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Uitgever: |
Published by Elsevier B.V. |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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