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Deep-level transient spectroscopy measurements of majority carrier traps in neutron irradiated n-type silicon detectors |
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Titel: |
Deep-level transient spectroscopy measurements of majority carrier traps in neutron irradiated n-type silicon detectors |
Auteur: |
Borchi, E. Bertrand, C. Leroy, C. Bruzzi, M. Furetta, C. Paludetto, R. Rancoita, P.G. Vismara, L. Giubellino, P. |
Verschenen in: |
Nuclear instruments and methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment |
Paginering: |
Jaargang 279 (1989) nr. 1-2 pagina's 4 p. |
Jaar: |
1989 |
Inhoud: |
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Uitgever: |
Published by Elsevier B.V. |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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