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Heavy-ion beam test of a monolithic silicon pixel sensor with a new 130 nm High-Resistivity CMOS process |
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Titel: |
Heavy-ion beam test of a monolithic silicon pixel sensor with a new 130 nm High-Resistivity CMOS process |
Auteur: |
Yang, Haibo Mai, Fatai Liao, Jianwei Zhang, Honglin Ma, Xiaomeng Gao, Chaosong Ren, Weiping Zhou, Wei Sun, Xiangming Liu, Jun Li, Xianqin Niu, Xiaoyang Chen, Xurong Zhao, Chengxin |
Verschenen in: |
Nuclear instruments and methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment |
Paginering: |
Jaargang 1039 () nr. C pagina's p. |
Jaar: |
2022 |
Inhoud: |
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Uitgever: |
Published by Elsevier B.V. |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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