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An electron microscope study of near-surface damage caused by Xe and Ne ion implantation in CuInSe2 single crystals |
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Titel: |
An electron microscope study of near-surface damage caused by Xe and Ne ion implantation in CuInSe2 single crystals |
Auteur: |
Zegadi, A. Belattar, A. Faunce, C.A. Ahmed, E. Anwar, S. Yakushev, M.V. Imanieh, M. Slifkin, M.A. Hill, A.E. Tomlinson, R.D. |
Verschenen in: |
Nuclear instruments and methods in physics research. Section B, Beam interactions with materials and atoms |
Paginering: |
Jaargang 94 (1994) nr. 4 pagina's 4 p. |
Jaar: |
1994 |
Inhoud: |
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Uitgever: |
Published by Elsevier B.V. |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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