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                                       Details for article 8 of 89 found articles
 
 
  Analysis of boron-doped amorphous silicon by means of a heavy-ion time-of-flight ERD spectrometer
 
 
Title: Analysis of boron-doped amorphous silicon by means of a heavy-ion time-of-flight ERD spectrometer
Author: Arai, E.
Zounek, A.
Sekino, N.
Saito, K.
Appeared in: Nuclear instruments and methods in physics research. Section B, Beam interactions with materials and atoms
Paging: Volume 89 (1994) nr. 1-4 pages 4 p.
Year: 1994
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 8 of 89 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands