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                                       Details for article 30 of 85 found articles
 
 
  Evaluation of single-event immunity in micron-size device area using single-ion microprobe technique
 
 
Title: Evaluation of single-event immunity in micron-size device area using single-ion microprobe technique
Author: Takashi Matsukawa,
Katsunori Noritake,
Meishoku Koh,
Ken-ichi Hara,
Makoto Goto,
Iwao Ohdomari,
Appeared in: Nuclear instruments and methods in physics research. Section B, Beam interactions with materials and atoms
Paging: Volume 77 (1993) nr. 1-4 pages 4 p.
Year: 1993
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 30 of 85 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands