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Details for article 38 of 39 found articles
| Title: |
Thickness and uniformity mapping of thin foils using resistive silicon detectors |
| Author: |
Hankins, T. McIntosh, A.B. Hagel, K. Abbott, A.D. Alvarez, A. Bartsch, R. McClure, M. Regener, S. Sorensen, M.Q. Yennello, S.J. |
| Appeared in: |
Nuclear instruments and methods in physics research. Section B, Beam interactions with materials and atoms |
| Paging: | Volume 566 () nr. C pages p. |
| Year: |
2025 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 38 of 39 found articles
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