A study on the gamma and swift heavy ion irradiation-induced effects on the electrical properties of TaO x -based MOS capacitors
Titel:
A study on the gamma and swift heavy ion irradiation-induced effects on the electrical properties of TaO x -based MOS capacitors
Auteur:
Goud, R. Sai Prasad Akkanaboina, Mangababu Machiboyina, Sravani Kumar, Kanaka Ravi Anjum, Arshiya Khan, Saif A. Prakash, A.P. Gnana Pathak, A.P. Rao, S.V.S. Nageswara
Verschenen in:
Nuclear instruments and methods in physics research. Section B, Beam interactions with materials and atoms