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                                       Details for article 15 of 24 found articles
 
 
  4H-SiC Schottky diode radiation hardness assessment by IBIC microscopy
 
 
Title: 4H-SiC Schottky diode radiation hardness assessment by IBIC microscopy
Author: Vittone, Ettore
Olivero, Paolo
Jakšic̈, Milko
Pastuović, Željko
Appeared in: Nuclear instruments and methods in physics research. Section B, Beam interactions with materials and atoms
Paging: Volume 537 () nr. C pages 14-22
Year: 2023
Contents:
Publisher: Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 15 of 24 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands