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                                       Details for article 14 of 28 found articles
 
 
  Insights into secondary ion formation during dynamic SIMS analysis: Evidence from sputtering of laboratory synthesized uranium compounds with a high-energy O− primary beam on a NanoSIMS 50L
 
 
Title: Insights into secondary ion formation during dynamic SIMS analysis: Evidence from sputtering of laboratory synthesized uranium compounds with a high-energy O− primary beam on a NanoSIMS 50L
Author: Zirakparvar, N. Alex
Spano, Tyler L.
Miskowiec, Andrew
Smith, Julie B.
Hexel, Cole R.
Ambrogio, Michael
Kapsimalis, Roger
Appeared in: Nuclear instruments and methods in physics research. Section B, Beam interactions with materials and atoms
Paging: Volume 502 () nr. C pages 164-175
Year: 2021
Contents:
Publisher: The Author(s)
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 14 of 28 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands