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Details for article 12 of 91 found articles
| Title: |
Angular dependence of the self-ion-sputtering yield of silicon at 30 keV |
| Author: |
Fröhlich, O. Baumann, H. Bethge, K. |
| Appeared in: |
Nuclear instruments and methods in physics research. Section B, Beam interactions with materials and atoms |
| Paging: | Volume 50 (1990) nr. 1-4 pages 3 p. |
| Year: |
1990 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 12 of 91 found articles
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