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                                       Details for article 25 of 51 found articles
 
 
  Investigations on the displacement damage dose effects induced by heavy ion irradiation in silicon PiN photodiodes: Implications for modeling and simulation
 
 
Title: Investigations on the displacement damage dose effects induced by heavy ion irradiation in silicon PiN photodiodes: Implications for modeling and simulation
Author: Riffaud, Jonathan
Gaillardin, Marc
Raine, Mélanie
Martinez, Martial
Peyre, Daniel
Marcandella, Claude
Duhamel, Olivier
Lagutère, Thierry
Richard, Nicolas
Paillet, Philippe
Appeared in: Nuclear instruments and methods in physics research. Section B, Beam interactions with materials and atoms
Paging: Volume 460 () nr. C pages 52-55
Year: 2019
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 25 of 51 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands