Investigations on the displacement damage dose effects induced by heavy ion irradiation in silicon PiN photodiodes: Implications for modeling and simulation
Title:
Investigations on the displacement damage dose effects induced by heavy ion irradiation in silicon PiN photodiodes: Implications for modeling and simulation
Author:
Riffaud, Jonathan Gaillardin, Marc Raine, Mélanie Martinez, Martial Peyre, Daniel Marcandella, Claude Duhamel, Olivier Lagutère, Thierry Richard, Nicolas Paillet, Philippe
Appeared in:
Nuclear instruments and methods in physics research. Section B, Beam interactions with materials and atoms