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Journal description
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Details for article 57 of 92 found articles
| Title: |
Oxygen depth profiling study of copper oxide films on silicon (100) substrates by 16O(α,α)16O resonance |
| Author: |
Jian, Li Matienzo, L.J. Revesz, P. Vizkelethy, Gy. Wang, S.Q. Kaufman, J.J. Mayer, J.W. |
| Appeared in: |
Nuclear instruments and methods in physics research. Section B, Beam interactions with materials and atoms |
| Paging: | Volume 46 (1990) nr. 1-4 pages 4 p. |
| Year: |
1990 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 57 of 92 found articles
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