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Preliminary single event effect distribution investigation on 28 nm SoC using heavy ion microbeam |
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Titel: |
Preliminary single event effect distribution investigation on 28 nm SoC using heavy ion microbeam |
Auteur: |
Yang, Weitao Du, Xuecheng Guo, Jinlong Wei, Junze Du, Guanghua He, Chaohui Liu, Wenjing Shen, Shuaishuai Huang, Chengliang Li, Yonghong Fan, Yunyun |
Verschenen in: |
Nuclear instruments and methods in physics research. Section B, Beam interactions with materials and atoms |
Paginering: |
Jaargang 450 () nr. C pagina's 323-326 |
Jaar: |
2019 |
Inhoud: |
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Uitgever: |
Elsevier B.V. |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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