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Effects of argon thermal annealing on surface structure, microstructural and silicide formation of Silicon-Titanium-Cobalt thin film |
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Titel: |
Effects of argon thermal annealing on surface structure, microstructural and silicide formation of Silicon-Titanium-Cobalt thin film |
Auteur: |
Mtshali, Christopher Khumalo, Zakhelumuzi Mocumi, Gladness Lebesana, Keletso Kheswa, Ntombizonke Magogodi, Steven Cummings, Francious Pieters, Caswell Nkosi, Mlungisi |
Verschenen in: |
Nuclear instruments and methods in physics research. Section B, Beam interactions with materials and atoms |
Paginering: |
Jaargang 445 (2019) nr. C pagina's 18-25 |
Jaar: |
2019 |
Inhoud: |
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Uitgever: |
Elsevier B.V. |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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