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                                       Details for article 23 of 25 found articles
 
 
  Shallow junction formation with boron fluoride and low energy boron ion implantation into silicon
 
 
Title: Shallow junction formation with boron fluoride and low energy boron ion implantation into silicon
Author: Lu, Zhiheng
Zhang, Chaoming
Li, Sujie
Luo, Yan
Zhang, Huixing
Appeared in: Nuclear instruments and methods in physics research. Section B, Beam interactions with materials and atoms
Paging: Volume 43 (1989) nr. 1 pages 4 p.
Year: 1989
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 23 of 25 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands