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Details for article 1 of 10 found articles
| Title: |
Analysis of Total Ionizing Dose effects for highly scaled CMOS devices in Low Earth Orbit |
| Author: |
Sajid, Muhammad Chechenin, N.G. Sill Torres, Frank Nabeel Hanif, Muhammad Gulzari, Usman Ali Arslan, Shakaib Khan, Ehsan Ullah |
| Appeared in: |
Nuclear instruments and methods in physics research. Section B, Beam interactions with materials and atoms |
| Paging: | Volume 428 () nr. C pages 30-37 |
| Year: |
2018 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 1 of 10 found articles
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