|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 28 of 60 found articles
| Title: |
Low energy proton induced single event upset in 65nm DDR and QDR commercial SRAMs |
| Author: |
Ye, B. Liu, J. Wang, T.S. Liu, T.Q. Maaz, K. Luo, J. Wang, B. Yin, Y.N. Ji, Q.G. Sun, Y.M. Hou, M.D. |
| Appeared in: |
Nuclear instruments and methods in physics research. Section B, Beam interactions with materials and atoms |
| Paging: | Volume 406 (2017) nr. PB pages 443-448 |
| Year: |
2017 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 28 of 60 found articles
| << previous | next >> |