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  A comparison of heavy ion induced single event upset susceptibility in unhardened 6T/SRAM and hardened ADE/SRAM
 
 
Title: A comparison of heavy ion induced single event upset susceptibility in unhardened 6T/SRAM and hardened ADE/SRAM
Author: Wang, Bin
Zeng, Chuanbin
Geng, Chao
Liu, Tianqi
Khan, Maaz
Yan, Weiwei
Hou, Mingdong
Ye, Bing
Sun, Youmei
Yin, Yanan
Luo, Jie
Ji, Qinggang
Zhao, Fazhan
Liu, Jie
Appeared in: Nuclear instruments and methods in physics research. Section B, Beam interactions with materials and atoms
Paging: Volume 406 (2017) nr. PB pages 437-442
Year: 2017
Contents:
Publisher: Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

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