A comparison of heavy ion induced single event upset susceptibility in unhardened 6T/SRAM and hardened ADE/SRAM
Title:
A comparison of heavy ion induced single event upset susceptibility in unhardened 6T/SRAM and hardened ADE/SRAM
Author:
Wang, Bin Zeng, Chuanbin Geng, Chao Liu, Tianqi Khan, Maaz Yan, Weiwei Hou, Mingdong Ye, Bing Sun, Youmei Yin, Yanan Luo, Jie Ji, Qinggang Zhao, Fazhan Liu, Jie
Appeared in:
Nuclear instruments and methods in physics research. Section B, Beam interactions with materials and atoms