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                                       Details for article 1 of 8 found articles
 
 
  A simple analytical model of single-event upsets in bulk CMOS
 
 
Title: A simple analytical model of single-event upsets in bulk CMOS
Author: Sogoyan, Armen V.
Chumakov, Alexander I.
Smolin, Anatoly A.
Ulanova, Anastasia V.
Boruzdina, Anna B.
Appeared in: Nuclear instruments and methods in physics research. Section B, Beam interactions with materials and atoms
Paging: Volume 400 (2017) nr. C pages 6 p.
Year: 2017
Contents:
Publisher: Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

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 Koninklijke Bibliotheek - National Library of the Netherlands