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Details for article 23 of 24 found articles
| Title: |
Two-dimensional dopant profiling of gallium nitride p–n junctions by scanning capacitance microscopy |
| Author: |
Lamhamdi, M. Cayrel, F. Frayssinet, E. Bazin, A.E. Yvon, A. Collard, E. Cordier, Y. Alquier, D. |
| Appeared in: |
Nuclear instruments and methods in physics research. Section B, Beam interactions with materials and atoms |
| Paging: | Volume 372 (2016) nr. C pages 5 p. |
| Year: |
2016 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 23 of 24 found articles
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