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Journal description
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Details for article 17 of 24 found articles
| Title: |
Real-time and on-site γ-ray radiation response testing system for semiconductor devices and its applications |
| Author: |
Mu, Yifei Zhao, Ce Zhou Qi, Yanfei Lam, Sang Zhao, Chun Lu, Qifeng Cai, Yutao Mitrovic, Ivona Z. Taylor, Stephen Chalker, Paul R. |
| Appeared in: |
Nuclear instruments and methods in physics research. Section B, Beam interactions with materials and atoms |
| Paging: | Volume 372 (2016) nr. C pages 15 p. |
| Year: |
2016 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 17 of 24 found articles
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