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Influence of edge effects on single event upset susceptibility of SOI SRAMs |
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Title: |
Influence of edge effects on single event upset susceptibility of SOI SRAMs |
Author: |
Gu, Song Liu, Jie Zhao, Fazhan Zhang, Zhangang Bi, Jinshun Geng, Chao Hou, Mingdong Liu, Gang Liu, Tianqi Xi, Kai |
Appeared in: |
Nuclear instruments and methods in physics research. Section B, Beam interactions with materials and atoms |
Paging: |
Volume 342 (2015) nr. C pages 6 p. |
Year: |
2015 |
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Publisher: |
Elsevier B.V. |
Source file: |
Elektronische Wetenschappelijke Tijdschriften |
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