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                                       Details for article 87 of 102 found articles
 
 
  Surface sensitivity of secondary ion mass spectroscopy in the electronic sputtering regime
 
 
Title: Surface sensitivity of secondary ion mass spectroscopy in the electronic sputtering regime
Author: Nakajima, Kaoru
Miyashita, Motoki
Suzuki, Motofumi
Kimura, Kenji
Appeared in: Nuclear instruments and methods in physics research. Section B, Beam interactions with materials and atoms
Paging: Volume 332 (2014) nr. C pages 4 p.
Year: 2014
Contents:
Publisher: Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 87 of 102 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands