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                                       Details for article 78 of 102 found articles
 
 
  Simultaneous quantification of light elements in thin films deposited on Si substrates using proton EBS (Elastic Backscattering Spectroscopy)
 
 
Title: Simultaneous quantification of light elements in thin films deposited on Si substrates using proton EBS (Elastic Backscattering Spectroscopy)
Author: Ferrer, F.J.
Alcaire, M.
Caballero-Hernández, J.
Garcia-Garcia, F.J.
Gil-Rostra, J.
Terriza, A.
Godinho, V.
García-López, J.
Barranco, A.
Fernández-Camacho, A.
Appeared in: Nuclear instruments and methods in physics research. Section B, Beam interactions with materials and atoms
Paging: Volume 332 (2014) nr. C pages 5 p.
Year: 2014
Contents:
Publisher: Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 78 of 102 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands