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                                       Details for article 10 of 14 found articles
 
 
  Residual stress analysis of TiN film fabricated by plasma immersion ion implantation and deposition process
 
 
Title: Residual stress analysis of TiN film fabricated by plasma immersion ion implantation and deposition process
Author: Liu, Hongxi
Xu, Qian
Zhang, Xiaowei
Wang, Chuanqi
Tang, Baoyin
Appeared in: Nuclear instruments and methods in physics research. Section B, Beam interactions with materials and atoms
Paging: Volume 297 (2013) nr. C pages 6 p.
Year: 2013
Contents:
Publisher: Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 10 of 14 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands