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Direct observation of fine structure in ion tracks in amorphous Si3N4 by TEM |
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Titel: |
Direct observation of fine structure in ion tracks in amorphous Si3N4 by TEM |
Auteur: |
Nakajima, K. Morita, Y. Suzuki, M. Narumi, K. Saitoh, Y. Ishikawa, N. Hojou, K. Tsujimoto, M. Isoda, S. Kimura, K. |
Verschenen in: |
Nuclear instruments and methods in physics research. Section B, Beam interactions with materials and atoms |
Paginering: |
Jaargang 291 (2012) nr. C pagina's 5 p. |
Jaar: |
2012 |
Inhoud: |
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Uitgever: |
Elsevier B.V. |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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